We’re going to look at some ways you can fully take advantage of a network analyzer’s advanced features to simplify active device characterization and reduce design cycles. Traditionally, multi-instrument RF test systems are created to meet the challenges of active device characterization.Īs network analyzers become more advanced and integrated, engineers can simplify their test setups and perform complex characterization in a fraction of the time. Complex tests must be set up to find compression, intermodulation distortion (IMD), spurs, and more.
It requires much more than just S-parameters to completely characterize an active RF device.
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